
An AC coupled interconnect (ACCI) has been developed that could be used to create multiple solutions to contactless chip-to-chip communications. Assembly and testing of a 0.18 um bulk CMOS chip containing multiple circuit experiments were performed. Figure 1 shows the chip floorplan, chip layout for the wire bonded experiments, and a microscope photograph of the die. The experiments tested in this phase of measurements were located around the periphery of the die in the band designated in the die photo of Figure 1.
Capacitive coupling with the capacitor formed between the chip and a package was demonstrated. Chips were built in a 0.35-μm process and flipped to an MCM substrate. The chips can communicate with each other at 2.5 Gbps over a 5-cm transmission line. Pad sizes down to 70-μm pitch were demonstrated.
Inductively coupled circuits communicating vertically through a 3D chip-stack were demonstrated. This chip was built in a 0.35-μm process and operated at 2 GHz. Communication was possible with a chip thickness of up to 120 mm. An inductively coupled connector, prototyped in a PCB technology, was demonstrated to operate at 250 MHz. Figure 2 shows a prototype and an eye diagram.
This work was done by Paul D. Franzon of North Carolina State University for the Air Force Research Laboratory. AFRL-0115
AC Coupled Interconnect for Low-Power Spaceborne Electronics (reference AFRL-0115) is currently available for download from the TSP library.
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