
Two developments improve the utilization of flash memory devices in the face of the following limitations: (1) a flash write element (page) differs in size from a flash erase element (block), (2) a block must be erased before its is rewritten, (3) lifetime of a flash memory is typically limited to about 1,000,000 erases, (4) as many as 2 percent of the blocks of a given device may fail before the expected end of its life, and (5) to ensure reliability of reading and writing, power must not be interrupted during minimum specified reading and writing times.
Viewing entire briefs requires login/registration. Registration is free and easy to complete. If you're already registered with Tech Briefs, simply login at the top of the page.
Subscribe today to receive the INSIDER, a FREE e-mail newsletter from Defense Tech Briefs featuring exclusive previews of upcoming articles, late breaking NASA and industry news, hot products and design ideas, links to online resources, and much more.