Effects of High-Power Microwave Pulses on Electronic Systems

This research can be applied to designing electronic circuits to be less vulnerable to damage from radiation.

A five-year program comprising several coordinated research efforts was devoted to increasing understanding and developing capabilities for computational modeling of the effects of highpower microwave (HPM) radiation upon electronic circuits and upon systems that comprise or include electronic circuits. The HPM radiation of primary interest in this program included both narrow-band and ultra- wide-band (UWB) pulsed radiation. Whether aimed at electronic equipment deliberately or inadvertently, either type of radiation can, potentially, cause damage and/or adversely affect operation. The knowledge gained from this program can help in designing future electronic circuits and systems to be less vulnerable to damage and disruption by incident HPM/UWB radiation.