To fully exploit the chamber’s capabilities, AFRL scientists developed processing algorithms to generate gradient and multilayer coatings and selected a programmable controller that provides the flexibility to continuously vary coating composition when creating complex graded structures. For example, they can program the deposition system either to produce nanocomposite coatings comprising specific quantities of metal, ceramic, carbon, and dichalcogenide materials or to form multilayer coatings from combinations of these materials.

Scientists are interested in gradient films because they eliminate incompatibility problems between successive coating layers. These problems—lack of adhesion, for example—stem from a poor lattice match from one deposition material to another. Scientists are also interested in research indicating that certain nanocomposite films demonstrate a unique adaptive behavior, abruptly changing chemistry and structure when moved between earth and space environments, yet still providing continuous lubrication. AFRL researchers are using the new deposition chamber to produce these “chameleon” films for various Air Force space applications.

The research and discovery opportunities made possible by the new automated deposition chamber will ultimately improve the performance and reliability of critical aerospace systems and subsystems and enhance AFRL’s reputation as a center of excellence for materials and manufacturing research and development. While scientists have yet to realize the new chamber’s full potential in advancing nanotechnology and other emergent fields, they are actively studying improvements in the solid lubrication and wear protection of rods, bearings, bearing races, and other components used in aerospace systems.

Dr. Andrey A. Voevodin, Dr. John G. Jones, and Dr. Peter S. Meltzer (Anteon Corporation), of the Air Force Research Laboratory’s Materials and Manufacturing Directorate, wrote this article. For more information, contact TECH CONNECT at (800) 203-6451 or place a request at http://www.afrl.af.mil/techconn_index.asp. Reference document ML-H-05-15.