Digital Light Control Simplifies Focal Plane Array Testing and Image Sensor Production

Monday, December 01 2008

Characterization of the performance of image sensors and image sensor systems is critical to success in many defense and security applications. From image sensors used in the recording of fast processes, to the use of sensors in munitions development and performance analysis, to the “eyes” on un - manned vehicles and targeting image sensors, new and better methods for testing and characterization of sensors are now being employed.

Important performance parameters that are now being used to determine the limits of field application include testing for quantum efficiency, noise floor, gain, and wavelength of available optical energy. No one would want to deploy a sensor or system in the field that would not provide adequate imaging in all scenarios of a mission.

The advent of digitally controlled, solid-state lamp (SSL)-based light source instruments has greatly simplified the testing process and substantially lowered costs associated with performance characterization in image sensor components production and integrated camera testing. New techniques for testing the offset bias, gain, noise floor, spectral gain, and quantum efficiency characteristics of focal plane arrays (FPAs), CCDs, and CMOS image sensors are now available with digital control devices that offer stability, programmability, linearity, and uniformity.

Many image sensor performance evaluation and testing applications are well suited to utilize the advantages of single-spectral and multi-spectral channel digital-control standard light sources. A multi-channel light source instrument can emulate and switch illuminants at will, with repeatability and consistency, outperforming conventional sources.