Mar 2010
Integrating Ultra-Fast Waveform Generation and Measurement with Traditional DC I-V and C-V Measurements
Characterizing a semiconductor device, material, or process thoroughly requires the ability to make three types of measurements. The first two types are the most familiar: precision DC I‐V measurements (typically made with high-precision Source-Measure Units or SMUs) and AC impedance measurements (in the semiconductor industry, often made with a ...
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Custom Microwave Subsystem Design Leveraging COTS Methodology
Designing test systems based on commercial-off-the-shelf (COTS)
instrumentation can reduce non-recurring engineering costs and time to
production by providing a reusable infrastructure that is usually based
on industry standards. Custom designs can result in high maintenance
costs due to premature obsolescence; these implementations often lack
adequate documentation required for sustained ...
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Test Goes Software Defined
Software-defined instrumentation is the new face of automated test. Scientists and engineers performing leading-edge research and designing custom measurement and control systems have used software-defined instruments, also known as virtual instruments, for more than 20 years. Software-defined instruments were critical for these often one-of-a-kind applications due to their unique system requirements. ...
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Jan 2010
High Precision Image Based InspectionDec 2009
Pulse Testing for Nanoscale DevicesTechnical Series on Data Acquisition – Data Sampling
Choosing a high-speed instrument: Stand-Alone Oscilloscopes versus PC-Based Digitizers
Beyond Simulation: Real-world Multi-Channel GPS Signal Record & Playback for Navigation System
Nov 2009
Engineering Test Beds on the International Space StationOct 2009
Designing Automated Test SystemsSep 2009
FARO Gage vs. Traditional CMM - Video White PaperAndretti Green Racing Wins with the FARO Laser ScanArm - Video White Paper
LXI DAQ System Ensures Mission-Critical Reliability for Rocket Engine Testing
Colorimetry: How to Measure Color Differences
Using EDX Spectroscopy for Non-destructive Detection of Lead in Consumer Products
Aug 2009
Floating Signal Inputs Offer New Application AdvantagesApr 2009
Everything You Ever Wanted to Know about Data Acquisition, Part One — Analog InputsFeb 2009
Simplify Your DMM: Top Five Tools and Tips for Easier Automated MeasurementsJan 2009
Modular Oscilloscopes vs. DigitizersJul 2008
GPS Receiver TestingAdvanced RFID Measurements: Basic Theory to Protocol Conformance Test
Mar 2008
FPGAs - Under the HoodApr 2007
Controlling Stand-Alone and Modular Instruments with NI LabVIEW SignalExpressMar 2007
Interfacing NI PXI-655x Digital Waveform Generator/Analyzers to ECL Logic FamiliesPerform More Effective RF Measurements Using Vector Analysis
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