Dec 2011
Linking Early Mechatronic System Analysis to Physical Testing
Mechatronic system design creation and test development are often at
opposite ends of a project’s schedule. Benefits accrue in improved
system quality and on-time delivery when design and test are pursued
concurrently. This paper describes the technologies required to make
concurrent design and test possible.
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Oct 2011
An Improved Method for Differential Conductance MeasurementsGearing Up for Parametric Test’s High Voltage Future
Rapidly Expanding Array of Test Applications Continues to Drive Source Measurement Unit Instrument Technology
Aug 2011
Monitoring Theme Park and Amusement Rides using LGR-5329 Data LoggerMeasuring: The Key Component For Optimizing Your Solar Simulator
Jul 2011
Multi-Faceted Approach for Evaluating Lithium-Ion Battery SeparatorsJun 2011
Everything You Ever Wanted to Know about Data Acquisition, Part One — Analog InputsA Modern Alternative to Reflective Memory and VME
The Fastest, Easiest, Most Accurate Way To Compare Parts To Their CAD Data
May 2011
Hall Effect Measurements in Materials CharacterizationMar 2011
Accurate Low-Resistance Measurements Start with Identifying Sources of ErrorFeb 2011
DOE Relates Spring Probe Variables to Signal IntegrityOptimizing Low-Current Measurements and Instruments
Jan 2011
Develop Software for ATE SystemsLXI: The Solution for Data Acquisition
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